Expert Committee „Materialography“

FIB applications in materials characterization
Belongs to:
Materialography
Workgroup Members: 2

  • Working on tasks/problems related to Focused Ion Beam (FIB) applications in materials science, materials characterization and materials processing
    • Transmission Electron Microscopy sample preparation (inclusively lift-out techniques)
    • Cross-section preparation for Scanning Electron Microscopy
    • Contrast enhancement for Scanning Electron Microscopy (orientation contrast by channeling, materials contrast by different sputter rates, etc.)
    • FIB tomography
    • Micro mchining
  • Basic understanding of the interaction processes between ion beam and material
  • Initialization of research and development projects between research institutes, industry and tool suppliers
  • Establishing of projects for optimization of sample quality and reduced preparation time
  • Knowledge transfer between groups working in the field of FIB applications in materials science, materials characterization and materials processing
  • Establishing of suggestions/development requests for the tool suppliers (ion etching, FIB)


E 1


Z 1

Prof. Dr. Ehrenfried Zschech
Fraunhofer Institute for Ceramic Technologies and Systems IKTS
TC-Member

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