"The course provided powerful knowledge in the field of widely understood use of X-rays in materials characterization in order to describe their structure, composition, chemical bondings, 3D morphology etc. nondestructively. The course was planned in such a way to firstly present the physical background of the X-rays which is necessary to understand the possibilities and limitations of various laboratory techniques. The participants had the excellent opportunity to familiarize with techniques known for a long time as well as newly introduced and developed methods including in-situ and operando studies which may be applied in their everyday work. Moreover, it is worth to notice that, despite the webinar form, the participants had great opportunity to ask questions to the experts. The event was welly organized and I would definitely recommend it to everyone who works and who starts their adventure with X-rays.Martyna Strąg, Institute of Metallurgy and Materials Science of the Polish Academy of Sciences in Krakow


Laboratory X-ray techniques for materials development and process control

  • 12.04. - 14.04.2021


Advanced materials are increasingly enablers for high-tech products. The improved understanding of structure-property relationships of these materials is essential for their applications in many branches. Materials characterization provides the needed information about atomic structure, chemical binding and the 3D microstructure of advanced materials. Within this context, high-resolution X-ray techniques are playing an important role for the development and introduction of new technologies as well as for the integration of advanced materials into high-tech products, and particularly for process control and for quality assessment. One unique advantage of the X-ray techniques is that they deliver – generally integral – data for bulk materials and thin films nondestructively.

Topics and contents


X-ray techniques: Fundamentals, techniques and tools

Welcome and introduction: Fundamentals of X-ray physics
- Historical development, major inventions
- X-rays: Refraction, reflection, diffraction
- X-ray diffraction, spectroscopy, radiography/tomography
- Status and expected future developments
Prof. Dr. Ehrenfried Zschech, Dresden Fraunhofer Cluster Nanoanalysis (Germany)

X-ray experiments: Laboratory sources vs. synchrotron
- Generation of X-rays
- The integrated setup: Laboratory tool vs. synchrotron beamline

Dr. Jörg Grenzer, Helmholtz Zentrum Dresden-Rossendorf (Germany)

X-ray experiments: Optics and detectors
- X-ray optics: Reflective and diffractive optics
- X-ray detectors: 0D, 1D, 2D
Dr. Jörg Grenzer, Helmholtz Zentrum Dresden-Rossendorf (Germany)
Incl. Breaks from 10:30-10:45 and 11:45-12:00


Structure of materials, texture and stress: X-ray diffraction

X-ray diffraction: Structure and microstructure of crystalline materials
- Fundamentals of X-ray diffraction
- X-ray structure and microstructure analysis
- Texture and stress analysis
- Applications in materials science
Prof. Dr. David Rafaja, Technical University Bergakademie Freiberg (Germany)

3D imaging of materials: X-ray tomography and microscopy

X-ray tomography: 3D morphology and microstructure of materials
- Fundamentals of X-ray microscopy
- Radiography and high-resolution computed X-ray tomography
- Data analysis including AI algorithms
- Applications in materials science and biology
Prof. Dr. Ehrenfried Zschech, Dresden Fraunhofer Cluster Nanoanalysis (Germany)

In-situ and operando X-ray microscopy studies
- X-ray microscopy at several photon energies
- In-situ mechanical studies at composites and microchips
- Operando studies at systems for energy storage and conversion
MSc. Kristina Kutukova, Fraunhofer IKTS Dresden | Prof. Dr. Ehrenfried Zschech, Dresden Fraunhofer Cluster Nanoanalysis (Germany)
Incl. Breaks from 10:30-10:45 and 11:45-12:00


Composition of materials and chemical binding: X-ray spectroscopy

X-ray fluorescence spectroscopy: Elemental composition
- Fundamentals of X-ray fluorescence spectroscopy
- From point analysis to elemental mapping
- Scanning micro-XRF - a technique for qualitative and quantitative materials analysis
Dr. Roald Tagle, Bruker Nano, Berlin (Germany)

X-ray absorption spectroscopy: Local atomic and electronic structures of nanostructured materials
- Fundamentals of X-ray absorption spectroscopy, EXAFS and XANES analysis
- From ex-situ to operando XAS studies
- Applications in battery research, catalysis and biomedicine

Prof. Dr. Alexander V. Soldatov, University Rostov-on-Don (Russia)

Advanced data analysis

Big Data and AI algorithms for the analysis of X-ray spectroscopy data
- The need of Big Data
- Machine learning (ML) benefits
- Examples of ML applications in materials characterization
- Challenges and limits of the AI technologies
Prof. Dr. Alexander V. Soldatov, University Rostov-on-Don (Russia)

Summary and final remarks
Prof. Dr. Ehrenfried Zschech, Dresden Fraunhofer Cluster Nanoanalysis (Germany)

Incl. Breaks from 10:00-10:15 and 11:15-11:30

Your benefit

  • The course will provide the knowledge needed for materials characterization using X-ray techniques:
    - Fundamentals of X-ray physics
    - X-ray diffraction for phase, texture and stress analysis of materials
    - X-ray spectroscopy for the determination of materials composition and chemical binding
    - X-ray microscopy and X-ray computed tomography for 3D morphology and microstructure analysis of materials
    - Advanced concepts for data analysis including Artificial Intelligence algorithms.
  • Capabilities and limits of the experimental techniques, including spatial resolution, detection limit and the time needed for data acquisition and data analysis (“time-to-data”) will be discussed for specific use-cases in basic research and application
  • Data acquisition, data processing and data analysis, including the application of machine learning algorithms, will be demonstrated.
  • New results from fundamental research will be presented, and application-specific solutions in the fields of metallurgy, renewable energies, biomimetics and microelectronics will be provided.
  • In-situ and operando studies of kinetic processes, e.g. micro-crack propagation and fracture of materials as well as electrochemical reactions for energy storage and conversion, will be demonstrated.
  • The potential of X-ray techniques for materials characterization as well as for the generation of data that describe structure, composition and chemical binding as well as 3D morphology and microstructure of materials will be explained by an experienced team of lecturers from academia and industry with knowledge in the fields of materials science, physical and chemical materials analysis as well as advanced data analysis.

Target audience

  • The course is intended for individuals who wish to expand their knowledge in the field of X-ray techniques for materials characterization, both in research and in practical applications for process control and reliability engineering. The subjects covered in this course extend from materials science and materials analysis up to the current challenges in industry, particularly in process monitoring and quality assurance.
  • Scientists, engineers and technicians working in industry – in manufacturing, process and quality control and R&D – as well as scientists, engineers and PhD students from research institutes and universities, who are interested to extend their knowledge in materials characterization, particularly using X-ray techniques, will benefit from this course.

Organisation | Information

Event Dates in detail: 

Day ONE: 9 AM - 1 PM
Day TWO: 9 AM - 1 PM
Day THREE: 9 AM - 1 PM

Dial-in Information will be send by e-mail to the participants one day before the training course starts.
The software ZOOM will be used for the training course.

Further training courses

  • Will follow soon 


Prof. Dr. Ehrenfried Zschech

Fraunhofer-Institut für Keramische Technologien und Systeme IKTS

Prof. Dr. Soldatov Alexander

Southern Federal University

Dr. Jörg Grenzer

Helmholtz-Zentrum Dresden-Rossendorf e.V.

Kristina Kutukova

Fraunhofer-Institut für Keramische Technologien und Systeme IKTS

Prof. Dr. David Rafaja

TU Bergakademie Freiberg

Dr. Roland Tagle

Bruker Nano GmbH

Fragen und Kontakt

Gerne beantworten wir Ihre Fragen zur Fortbildung auch persönlich. Rufen Sie uns einfach an oder senden Sie uns eine E-Mail.

Tel.: +49-(0)69-75306 757
Fax: +49-(0)69-75306 733
E-Mail: fortbildung@dgm.de