"The course provided powerful knowledge in the field of widely understood use of X-rays in materials characterization in order to describe their structure, composition, chemical bondings, 3D morphology etc. nondestructively. The course was planned in such a way to firstly present the physical background of the X-rays which is necessary to understand the possibilities and limitations of various laboratory techniques. The participants had the excellent opportunity to familiarize with techniques known for a long time as well as newly introduced and developed methods including in-situ and operando studies which may be applied in their everyday work. Moreover, it is worth to notice that, despite the webinar form, the participants had great opportunity to ask questions to the experts. The event was welly organized and I would definitely recommend it to everyone who works and who starts their adventure with X-rays.Martyna Strąg, Institute of Metallurgy and Materials Science of the Polish Academy of Sciences in Krakow


Laboratory X-ray techniques for materials development and process control

  • 12.04. - 14.04.2021


Advanced materials are increasingly enablers for high-tech products. The improved understanding of structure-property relationships of these materials is essential for their applications in many branches. Materials characterization provides the needed information about atomic structure, chemical binding and the 3D microstructure of advanced materials. Within this context, high-resolution X-ray techniques are playing an important role for the development and introduction of new technologies as well as for the integration of advanced materials into high-tech products, and particularly for process control and for quality assessment. One advantage of the X-ray techniques is that they deliver – generally integral – data for bulk materials and thin films nondestructively.

In this course, we will explain in detail:

  • X-ray diffraction for phase, texture and stress analysis of materials
  • X-ray spectroscopy for the determination of materials composition and chemical binding
  • X-ray microscopy and X-ray computed tomography for 3D morphology and microstructure analysis of materials.

Topics and contents

  • Fundamentals in X-ray physics
  • X-ray experiments: Tools and components – Laboratory vs. synchrotron
  • X-ray diffraction: Structure and microstructure of crystalline materials
  • X-ray fluorescence spectroscopy: Elemental composition
  • X-ray absorption spectroscopy: Local atomic and electronic structures of nanostructured materials
  • Big Data and AI algorithms for the analysis of X-ray spectroscopy data
  • X-ray microscopy: 3D morphology and microstructure of materials
  • In-situ and operando X-ray microscopy studies

Your benefit

  • The course will provide you knowledge in the field of materials characterization using X-ray techniques.
  • Capabilities and limits of these techniques, including spatial resolution, detection limit and the time needed for data acquisition and data analysis (“time-to-data”) will be discussed for specific use-cases in basic research and application, with the particular focus on the study of thin films as well as micro- and nanostructures.
  • In-situ and operando studies of kinetic processes in materials such as crack propagation and electrochemical reactions will be explained.
  • Data acquisition, data processing, and data analysis, including the application of algorithms of artificial intelligence, will be demonstrated.
  • An introduction into the fundamentals of X-ray physics, including the application of X-ray techniques in materials science and engineering, the experimental setups will be explained.
  • X-ray diffraction, X-ray spectroscopy and X-ray microscopy will be discussed in detail.
  • New results from fundamental research will be presented, and application-specific solutions in in the fields of metallurgy, renewable energies and lightweight construction as well as microelectronics will be demonstrated.
  • The potential of the use of X-ray techniques for materials characterization as well as for the generation of data that describe structure, composition and chemical binding as well as 3D morphology and microstructure of materials will be explained by an experienced team of lecturers from academia and industry with knowledge in the fields of materials science, physical and chemical materials analysis as well as advanced data analysis.


Target audience

  • The course is intended for individuals who wish to expand their knowledge in the field of X-ray techniques for materials characterization, both in research and in practical applications for process control and reliability engineering. The subjects covered in this course extend from materials science and materials analysis up to the current challenges in industry, particularly in process monitoring and quality assurance.
  • Scientists, engineers and technicians working in industry – in manufacturing, process and quality control and R&D – as well as scientists and engineers from research institutes and universities, who are interested to extend their knowledge in materials characterization, particularly using X-ray techniques, will benefit from this course.

Organisation | Information

Event Dates in detail: 

Day ONE: 2pm-5pm
Day TWO: 9am-6pm
Day THREE: 9am-1pm

Dial-in Information will be send by e-mail to the participants one day before the training course starts.
The software ZOOM will be used for the training course.

Further training courses

  • Will follow soon 


Prof. Dr. Ehrenfried Zschech

Fraunhofer-Institut für Keramische Technologien und Systeme IKTS

Prof. Dr. Soldatov Alexander

Southern Federal University

Dr. Jörg Grenzer

Helmholtz-Zentrum Dresden-Rossendorf e.V.

Kristina Kutukova

Fraunhofer-Institut für Keramische Technologien und Systeme IKTS

Prof. Dr. David Rafaja

TU Bergakademie Freiberg

Dr. Roland Tagle

Bruker Nano GmbH

Fragen und Kontakt

Gerne beantworten wir Ihre Fragen zur Fortbildung auch persönlich. Rufen Sie uns einfach an oder senden Sie uns eine E-Mail.

Tel.: +49-(0)69-75306 757
Fax: +49-(0)69-75306 733
E-Mail: fortbildung@dgm.de