LiteScope represents a next-generation tool for complex in-situ characterization of samples in the field of material science, semiconductors, or life science. It is equipped with CPEM technology allowing simultaneous acquisition and in-time correlation of various AFM and SEM signals covering surface topography, mechanical properties, SE, BSE, and other SEM images providing outstanding results. The measuring is time-efficient, precise and it provides complex sample analysis while preventing sensitive samples from surface contamination and oxidation.
612 00 Brno
From September 22 to 25, 2020, the German Materials Society (DGM) is organizing the "Materials Science and Engineering Congress" (MSE), which this year is taking place entirely virtually. During the four-day conference there will be an exhibition where, among other things, "NenoVision s.r.o." will be presented.
Further information about #MSE2020 can be found here!